SENTECH Thin Film Metrology Workshop 2026 – Two Days of Learning, Practical Experience and Knowledge Exchange
14–15 October 2026
Berlin-Adlershof, Germany
The SENTECH Thin Film Metrology Workshop 2026 brought together participants from research and industry for two days of technical discussions, hands-on training and knowledge exchange at SENTECH Instruments in Berlin-Adlershof.
This fully booked event provided an excellent opportunity for participants to deepen their understanding of spectroscopic ellipsometry, explore advanced thin-film characterisation techniques and exchange ideas directly with SENTECH’s application and development experts.
Ellipsometry is a high-precision optical metrology technique used to characterise thin films by determining their thickness, refractive index, and optical constants. At its core, ellipsometry quantifies how the polarisation state of light changes when interacting with a film-covered substrate. Spectroscopic Ellipsometry is a broadband optical metrology for thin-film characterisation. This ellipsometry technique analyses polarisation changes across a broad wavelength range, typically spanning the ultraviolet (UV), visible (VIS), and near-infrared (NIR) regions. This wavelength-dependent information enables the comprehensive determination of optical constants and thickness, even for complex multilayer structures.
From Theory to Practical Application
The workshop combined expert-led lectures with live demonstrations and practical measurement sessions, covering key aspects of spectroscopic ellipsometry, from fundamental measurement principles to advanced optical modelling and material characterisation.
Participants explored a range of topics, including measurement workflows, system operation, material dispersion analysis and the use of SENTECH SpectraRay/4 software for data analysis, optical modelling and measurement automation.
A particular highlight was the opportunity to work with real thin-film samples, allowing participants to discuss specific measurement challenges, investigate different approaches and gain practical insights into the characterisation of thin films and complex multilayer structures.
Sharing Knowledge and Building Connections
Beyond the technical programme, the workshop encouraged open discussions and the exchange of experiences between participants and SENTECH experts. The networking dinner provided a further opportunity to continue conversations, share ideas and network in a relaxed atmosphere with some great food.
Thank You to All Our Participants!
We would like to extend a huge thank you to everyone who attended the SENTECH Thin Film Metrology Workshop 2026. Your open and enthusiastic participation really contributed to the success of the event. The lively discussions and exchange of practical experiences made these two days a rewarding learning experience for everyone involved.
We hope you left Berlin with valuable new knowledge, practical insights and fresh ideas for your thin-film measurement and characterisation applications.
We look forward to welcoming you at SENTECH again very soon. Let’s continue the exchange of knowledge and expertise within the thin-film metrology community!
For a recap of the agenda, click Program SENTECH Metrology Workshop 2026
