Meet SENTECH at Perovskite Connect (Booth U02)
Berlin, Germany, 21 – 22 October 2026
As perovskite technologies move from research to scalable manufacturing, accurate and reliable thin-film characterisation becomes increasingly important.
Join us at booth U02 to learn more about SENTECH’s advanced thin-film metrology systems for non-destructive characterisation of thin films, multilayers and complex material stacks. Our solutions support the determination of key material and layer properties, including film thickness, refractive index, and extinction coefficient, from R&D through to process development and quality control.
- For perovskite research and manufacturing, thin-film metrology can support a wide range of applications, including:
- Perovskite solar cells and perovskite/silicon tandem photovoltaics
- Perovskite LEDs and display technologies
- Thin-film and multilayer stack characterisation
- Transparent conductive and functional layers
- Coatings and interfaces for optoelectronic devices
With solutions including spectroscopic ellipsometry to the FTIR range, fast and precise reflectometry and fully automated systems for QC, SENTECH provides flexible metrology capabilities for investigating increasingly complex thin-film materials and structures.
We look forward to meeting the perovskite community in Berlin and discussing how advanced thin-film characterisation can support the next generation of perovskite photovoltaics and optoelectronic devices. Our virtual booth is already live!
See you at Perovskite Connect in Berlin!
Click here to learn more about the event or to register. Use code GFS to receive a 50% discount on your individual pass.
