SENTECH Thin Film Metrology Workshop – Registration is now open!

Join the SENTECH Thin Film Metrology Workshop and unlock the full potential of spectroscopic ellipsometry.

Berlin-Adlershof, Germany, 14 to 15 October 2026

Ellipsometry is a high-precision optical metrology technique used to characterise thin films by determining their thickness, refractive index, and optical constants. At its core, ellipsometry quantifies how the polarisation state of light changes when interacting with a film-covered substrate. Spectroscopic Ellipsometry is a broadband optical metrology for thin-film characterisation. This ellipsometry technique analyses polarisation changes across a broad wavelength range, typically spanning the ultraviolet (UV), visible (VIS), and near infrared (NIR) regions. This wavelength-dependent information enables the comprehensive determination of optical constants and thickness, even for complex multilayer structures.

Work directly with the SENTECH application and development experts

Explore how advanced spectroscopic ellipsometry can expand and refine your thin film measurement and characterisation capabilities. Please feel free to bring your non-confidential thin film samples.

Workshop highlights include:

Expert-led interactive lectures from SENTECH Instruments
Live demonstrations of the powerful SENTECH SpectraRay/4 software
Hands-on practical sessions using your own samples
Networking opportunities, including a hosted dinner

Solve Real Sample Challenges with SENTECH Experts

Topics will include measurement workflows, system operation, automation with SpectraRay/4 software, material dispersion analysis, and optical modelling. The workshop is designed for participants of all experience levels, from beginners to advanced users. Take a look at the workshop agenda.

Registration & Questions

The workshop fee is 500 € per person and includes the networking dinner. PHD Students are encouraged to apply for a complimentary place.

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For further information or questions, please contact sales@sentech.de

Places are limited, so early registration is highly recommended. We look forward to welcoming you to Berlin-Adlershof for two days of practical insight, technical discussion, and thin film metrology expertise.

If you would like to find out more about the SENTECH spectroscopic ellipsometry systems, click here