Join the SENTECH Thin Film Metrology Workshop and unlock the full potential of spectroscopic ellipsometry.
Berlin-Adlershof, Germany, 14 to 15 October 2026
Work directly with the SENTECH application and development experts. Explore how advanced spectroscopic ellipsometry can expand and refine your thin film measurement and characterisation capabilities. Bring your non-confidential thin film samples.
Workshop highlights include:
- Expert-led interactive lectures from SENTECH Instruments
- Live demonstrations of the powerful SENTECH SpectraRay/4 software
- Hands-on practical sessions using your own samples
- Networking opportunities, including a hosted dinner
Solve Real Sample Challenges with SENTECH Experts
Topics will include measurement workflows, system operation, automation with SpectraRay/4 software, material dispersion analysis, and optical modelling. The workshop is designed for participants of all experience levels, from beginners to advanced users. A full agenda is coming soon!
Registration & Questions
The workshop fee is 500 € per person and includes the networking dinner. Students are encouraged to apply for a complimentary place.
Online registration for the event will open on 1 June! For further information or to register your interest, contact sales@sentech.de.
We look forward to welcoming you to Berlin-Adlershof for two days of practical insight, technical discussion, and thin film metrology expertise.
