SENTECH Thin Film Metrology Workshop – Save the Date!
Save the date for the 2026 Thin Film Metrology Workshop
SENTECH Academic & Research Access Program
SENTECH Academic & Research Access Program – Application process is open!
What is Ellipsometry?
Read our latest article to discover the principles and modern applications of ellipsometry
Processing Silicon Carbide (SiC), Understanding the Challenges and Finding Pathways to Precision
Read our latest article about SiC processing and characterisation
SENTECH Instruments and PVA TePla Launch Next-Generation LuXpector THEA at SEMICON Europa 2025
Learn more about the LuXpector THEA
Success at the SENTECH Thin Film Metrology Workshop 2025
The power of ellipsometry, transmission, and reflectometry, learn more
Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland
SENTECH application training in Poland
SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio
Read about this exciting collaboration
Successful Characterisation of Dielectric Layers on SiC for Next-Gen Semiconductor Applications
Explore our latest research and request the full application note.