SENTECH SENsol precision QC for Large Glass and Foil Substrates
The SENsol is designed for large glass and foil substrates, ensuring film thickness uniformity, quality and flatness.
RM 1000 QC Automated Spectroscopic Reflectometer for Quality Control
The RM 1000 QC is designed for fast and easy thickness measurement of transparent and semi-transparent films on patterned wafers for quality control within industrial production processes.
SENDURO accuva10 Fully-Automated Thin Film Quality Control
The SENDURO accuva10 is designed for fully automated, precise and repeatable measurement of film thickness, refractive index, and extinction coefficient of materials relevant to MEMS and sensor fabrication.
Quality Control
Quality control Quality control plays a crucial role in ensuring the reliability, performance, consistency of semiconductor etch and deposition processes. Using precision metrology tools ensures process optimisation. The SENTECH thin film metrology range of ellipsometers and reflectometers, in-situ, table top and fully automated tools for use in research and production can be used as part […]