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SER 800 PV Spectroscopic Ellipsometer for Photovoltaic Applications

The spectroscopic ellipsometer SER 800 PV is the ideal tool for the analysis of functional and antireflective coatings on textured crystalline silicon solar cells in a R&D environement.

Key features & benefits

Textured silicon wafers

With the SENTECH SER 800 PV spectroscopic ellipsometer for photovoltaics, anti-reflective coatings and passivation layers can be measured on textured monocrystalline and multicrystalline silicon wafers.

Multilayer AR coatings

Coatings of SiO₂ / SiN_x, Al₂O₃ / SiN_x, and SiN_x1 / SiN_x2, poly-Si, aSi / ITO, Perovskites can be analysed.

Easy operation

The SENTECH SER 800 PV spectroscopic ellipsometer for photovoltaics offers easy operation for both, experts and beginners. The recipe mode is especially suited for routine applications required in quality control.

The SENTECH SER 800 PV spectroscopic ellipsometer for photovoltaics matches the requirement for R&D of new solar cell technologies like PERC, TOPCON, HJT, and Perovskites technology. It offers easy operation for high measurement sensitivity, depolarisation correction, and special light-collecting optics making it the ideal tool for photovoltaic applications on rough sample surfaces.

Measurement on crystalline Silicon solar cell with alkaline textured surface

Flexibility and modularity

The SENTECH SER 800 PV is the ideal tool for the analysis of antireflective coatings and functional layers on textured crystalline and multicrystalline silicon solar cells. Single films (SiN_x, SiO₂, TiO₂, Al₂O₃, ITO, aSi, poly-Si and Perovskites) and multilayer stacks (SiN_X / SiO₂, SiN_x1 / SiN_x2, SiN_x / Al₂O₃, …) can be measured.

The tool is based on the Step Scan Analyser measurement mode. The Step Scan Analyser mode allows for matching the measurement parameters to rough sample surfaces, while all optical parts are at rest. The light source, optics, and detector of the SENTECH SER 800 PV are optimised for fast and accurate measurements of refractive index, absorption, and film thickness for PV applications. Moreover, the tool fulfils all requirements of the SENresearch spectroscopic ellipsometer family.

SpectraRay/4, the SENTECH proprietary ellipsometer software for the SENTECH SER 800 PV, comprises two modes of operation. The recipe mode allows for easy execution of routine applications in quality control. The interactive mode with a guiding graphical user interface is suited for R&D applications and the development of new recipes.

FAQ | Can you deliver SENTECH Ellipsometry Systems internationally?

SENTECH has an international network of distributors and technical service experts. We deliver globally, including Europe, Asia, Africa, North and South America. For more details on in-country representation, click here.

FAQ | Does SENTECH offer application support?

SENTECH has a large team of application experts for both plasma process technology and thin film metrology. At our campus are two laboratories which are used to process and characterise customer samples, for system demonstrations and customer training. SENTECH offers application support for the lifecycle of your system. Learn more about our application support or contact the team.

FAQ | Can I send my samples to SENTECH for analysis?

Yes, SENTECH has two application labs in-house. You can contact our application team, who will share with you all the details and provide a sample analysis form for you to complete. Click here for further information and contact details.

FAQ | Does SENTECH offer technical service support?

Yes, SENTECH has a large network of technical service experts who offer in-country support for both plasma process technology and thin film metrology systems. Remote or on-site support is possible depending on your requirements. Click here to find out more or to contact the team.