The SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry.
The SENTECH SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry.
There are no moving optical parts during data acquisition for best measurement results. The Step Scan Analyser (SSA) principle is a unique feature of the SENresearch 4.0 spectroscopic ellipsometer.
The extension of the SSA principle by the innovative 2C design allows measurement of the full Mueller matrix. The 2C design is a field upgradable and cost-effective accessory.
The SENTECH SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides the broadest spectral range with the best S/N ratio and the highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm.
Automated height and
tilt adjustment
Options and field up –
gradeable accessories
Motorised pyramid
goniometer (20° – 100°)
The motorised pyramid goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure the highest precision and long-term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle-resolved transmission measurements.
The tool operates on the Step Scan Analyser (SSA) principle. The SSA decouples the intensity measurement from mechanical movement, thereby allowing the analysis of even rough samples. All optical parts are at rest during data acquisition. Furthermore, the SENTECH SENresearch 4.0 includes a fast measurement mode for mapping and in-situ applications.
Customised ellipsometers of the SENresearch 4.0 can be configured for standard and advanced applications. Examples are dielectric layer stacks, textured surfaces, and optical and structural (3D) anisotropic samples. Predefined recipes are provided for a large variety of applications.
SpectraRay/4 is the comprehensive spectroscopic ellipsometer software for the tool. It comprises two modes of operation: The recipe mode and the interactive mode. The recipe mode allows for easy execution of routine applications. The interactive mode guides the ellipsometric measurement through an interactive graphical user interface.
DUV – VIS
190 – 1,000 nm
240 – 1,000 nm
NIR with Diode-Array
190 – 1,700 nm
240 – 1,700 nm
NIR with FTIR
190 – 2,500 nm
190 – 3,500 nm
240 – 2,500 nm
240 – 3,500 nm
SENTECH has an international network of distributors and technical service experts. We deliver globally, including Europe, Asia, Africa, North and South America. For more details on in-country representation, click here.
SENTECH has a large team of application experts for both plasma process technology and thin film metrology. At our campus are two laboratories which are used to process and characterise customer samples, for system demonstrations and customer training. SENTECH offers application support for the lifecycle of your system. Learn more about our application support or contact the team.
Yes, SENTECH has two application labs in-house. You can contact our application team, who will share with you all the details and provide a sample analysis form for you to complete. Click here for further information and contact details.
Yes, SENTECH has a large network of technical service experts who offer in-country support for both plasma process technology and thin film metrology systems. Remote or on-site support is possible depending on your requirements. Click here to find out more or to contact the team.
