
Measurement on crystalline silicon solar cell with alkaline textured surface
Precision Coating Evaluation
The SENTECH SE 400adv PV multi-angle laser ellipsometer can especially analyse coatings of SiNx, ITO, TiO2 and thin passivation layers of SiO2 and Al2O3. Double layer stacks can be analysed on smooth substrates.
The tool is a compact instrument, quickly up and running. SENTECH easy-to-use, recipe oriented software includes a comprehensive package of predefined applications that fit the requirements of R&D as well as of quality control in production environments.
Portable PECVD Diagnostics
A portable laser ellipsometer for photovoltaic applications is available for setting up and testing large PECVD systems long before the whole production line is running.

Laser ellipsometer SE 400adv PV
with portability option
