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Read about the latest company news and product developments from SENTECH.

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SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Academic & Research Access Program for Advanced Semiconductor Materials Research

Learn more about the SENTECH Access Program

SENTECH SI 500 D ICPECVD System with operator

Understanding Plasma Deposition

Read our article "Understanding Plasma Deposition" to explore the benefits of different process techniques

2019_Plasma_Lab

SENTECH Plasma Process Technology Seminar 2026 – Save the Date!

The SENTECH Plasma Seminar returns in 2026, dates now confirmed

SiC for power devices

Processing Silicon Carbide (SiC), Understanding the Challenges and Finding Pathways to Precision

Read our latest article about SiC processing and characterisation

LuXpector THEA - 2 Port

SENTECH Instruments and PVA TePla Launch Next-Generation LuXpector THEA at SEMICON Europa 2025

Learn more about the LuXpector THEA

SI 500 ALE

Understanding ALE, When is Atomic Layer Etching the answer?

Read our latest article about atomic layer etching

Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more

LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit

Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland

SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source

2019_Plasma_Lab

SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration

SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!

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