News

Read about the latest company news and product developments from SENTECH.

Dekoratives Bild
Dekoratives Bild
SENTECH SI 500 D ICPECVD System with operator

SENTECH Plasma Process Technology Seminar 2026 – Registration is now open!

SENTECH Plasma Process Technology Seminar 2026 – Register today!

Compact terahertz

Compact Terahertz Time-Domain Ellipsometer

Learn more about the Compact Terahertz Time-Domain Ellipsometer Project

What is plasma etching?

What is Plasma Etching?

To find out more about advanced plasma etching processes, read our article

Understanding Metrology

What is Ellipsometry?

Read our latest article to discover the principles and modern applications of ellipsometry

SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Academic & Research Access Program

Learn more about the SENTECH Access Program

SENTECH SI 500 D ICPECVD System with operator

Understanding Plasma Deposition

Read our article "Understanding Plasma Deposition" to explore the benefits of different process techniques

SiC for power devices

Processing Silicon Carbide (SiC), Understanding the Challenges and Finding Pathways to Precision

Read our latest article about SiC processing and characterisation

LuXpector THEA - 2 Port

SENTECH Instruments and PVA TePla Launch Next-Generation LuXpector THEA at SEMICON Europa 2025

Learn more about the LuXpector THEA

SI 500 ALE

Understanding ALE, When is Atomic Layer Etching the answer?

Read our latest article about atomic layer etching

Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more

LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit

Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland