Skip to content
Products
Plasma Process Technology
Plasma Process Technology
Low-damage plasma etch and deposition systems from SENTECH
Plasma Etching
ICPECVD Systems
Atomic Layer Deposition Systems
Cluster Configuration for Plasma Etching and Deposition
Thin Film Metrology
Thin Film Metrology
SENTECH thin film metrology tools for repeatable and accurate results
Metrology for Quality Control
Spectroscopic Ellipsometry
Spectroscopic Reflectometry
Laser Ellipsometry
In-situ Metrology / Endpoint Detection
Application and Industries
Application and Industries
Leading-edge application capabilities from SENTECH
Optoelectronics
MEMS
Sensors
Power Devices
Quality Control
Company
Company
About SENTECH, news and events
About SENTECH
News
Events
Downloads
Careers
Customer Support
Customer Support
SENTECH Sales, Application and Technical Service support
Worldwide Sales Network
Application Support
Technical Service Support
Search
Contact
SE 401adv
In-situ laser ellipsometer with a time resolution of 40 ms.
HeNe-laser for high stability and reproducibility
Kit for easily mounting the sender and receiver modules to the flanges of a process chamber