Al Real Time Monitor Laser Ellipsometer

SENTECH AL Real Time Monitor

The SENTECH AL Real Time Monitor is a proven optical diagnostic tool allowing fast process development with ultra-high resolution of single ALD and ALE cycles.

RM 1000 and RM 2000 Spectroscopic Reflectometry Tools

SENTECH RM 2000 for spectroscopic reflectometry

The spectroscopic reflectometry using the RM 1000/2000 features UV to NIR spectral range from 200 nm – 1000 nm. The optical layout is optimised for light throughput for reliable measurements of n and k even on rough or curved surfaces and with precise height and tilt adjustment.

SE 400adv Multiple-Angle Laser Ellipsometer

SENTECH SE 400adv

The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring measurement speed, Sub-Angstrom precision in thickness, and per mille accuracy in refractive index determination.

SI PEALD Plasma-Enhanced Atomic Layer Deposition System

SENTECH SI PEALD System

The SENTECH SI PEALD enables homogenous and conformal coating of sensitive substrates and layers at low temperatures. A high flux of reactive gas species is provided at the sample surface without UV radiation or ion bombardment.

Depolab 200 PECVD Open Lid System

SENTECH Depolab 200

The Depolab 200 is the basic plasma-enhanced chemical vapour deposition (PECVD) system suited to the deposition of dielectric films for etching masks, membranes, and electrically isolating films as well as many others.

SI 500 D ICPECVD System

Inductively coupled (IC) PECVD system, the SENTECH SI 500 D for high density, low ion energy, and low-pressure plasma deposition of dielectric films and low-damage, low-temperature deposition for passivation layers.