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Cluster Configuration for Plasma Etching and Deposition

SENTECH Cluster Tools comprise plasma etching and / or deposition modules, transfer chamber and vacuum load lock or cassette station for flexibiliy in wafer handling.

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SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Academic & Research Access Program

Learn more about the SENTECH Access Program

SENTECH SI 500 D ICPECVD System with operator

Understanding Plasma Deposition

Read our article "Understanding Plasma Deposition" to explore the benefits of different process techniques

SiC for power devices

Processing Silicon Carbide (SiC), Understanding the Challenges and Finding Pathways to Precision

Read our latest article about SiC processing and characterisation

LuXpector THEA - 2 Port

SENTECH Instruments and PVA TePla Launch Next-Generation LuXpector THEA at SEMICON Europa 2025

Learn more about the LuXpector THEA

SI 500 ALE

Understanding ALE, When is Atomic Layer Etching the answer?

Read our latest article about atomic layer etching

Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more

Plasma Process Technology
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition Systems
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition Systems
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition Systems
  • Cluster Configuration
  • Plasma Etching
  • ICPECVD Systems
  • Atomic Layer Deposition Systems
  • Cluster Configuration
Thin Film Metrology
  • Metrology for Quality Control
  • Spectroscopic Ellipsometry
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • In-situ Metrology / Endpoint Detection
  • Metrology for Quality Control
  • Spectroscopic Ellipsometry
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • In-situ Metrology / Endpoint Detection
  • Metrology for Quality Control
  • Spectroscopic Ellipsometry
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • In-situ Metrology / Endpoint Detection
  • Metrology for Quality Control
  • Spectroscopic Ellipsometry
  • Spectroscopic Reflectometry
  • Laser Ellipsometry
  • In-situ Metrology / Endpoint Detection
Application and Industries
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
  • Optoelectronics
  • MEMS
  • Sensors
  • Power Devices
  • Quality Control
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