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Read about the latest company news and product developments from SENTECH.

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Attendees of the SENTECH Thin Film Metrology Workshop 2025

Success at the SENTECH Thin Film Metrology Workshop 2025

The power of ellipsometry, transmission, and reflectometry, learn more

LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit

Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland

SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source

SENTECH Plasma Process Technology Application Lab

SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration

SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!

Dr. Marcel Schulze and Mr. Friedrich P. Witek

Leadership Announcement at SENTECH

Strengthened leadership team announced

Distributor meeting group photo

Global Collaboration in Action!

SENTECH Distributor Meeting 2025

Photo of delegates attending the 2025 SENTECH Plasma Seminar

SENTECH Plasma Process Technology Seminar 2025

A full event recap!

Helmut Witek

Honouring the Life and Legacy of Dr. Helmut Witek

Project Mexiquo Team

Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components

Learn more about “Projekt MEXSIQUO”

OptiRefS project

Learn More About the OptiRefS Project

Learn more about the OptiRefS project

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