Contact

News

Read about the latest company news and product developments from SENTECH.

LAAS_CNRS clean room visit

SENTECH at EUROnanoLAB 2025 CVD & ALD Workshop

Learn more about our recent visit

Thin film metrology application training

Empowering Research with our partners: Thin Film Metrology Application Training in Warsaw, Poland

SENTECH application training in Poland

SENTECH SI PEALD with PTSA ICP Source

A New Level of Configurability, the SENTECH SI PEALD System with ICP Source

Learn more about the SENTECH SI PEALD System with ICP Source

SENTECH Plasma Process Technology Application Lab

SENTECH Instruments and PVA TePla Join Forces to Expand Semiconductor Metrology Portfolio

Read about this exciting collaboration

SENTECH SENresearch 4.0 Spectroscopic Ellipsometer

SENTECH Thin Film Metrology Workshop

Register today to guarantee your place at the event!

Dr. Marcel Schulze and Mr. Friedrich P. Witek

Leadership Announcement at SENTECH

Strengthened leadership team announced

20250408_181618

Global Collaboration in Action!

SENTECH Distributor Meeting 2025

Photo of delegates attending the 2025 SENTECH Plasma Seminar

SENTECH Plasma Process Technology Seminar 2025

A full event recap!

2007_Helmuts 65 ter_Trauer original

Honouring the Life and Legacy of Dr. Helmut Witek

Project Mexiquo Team

Revolutionising Photonics: A Path to Affordable, Quantum-Enhanced Optical Components

Learn more about “Projekt MEXSIQUO”

OptiRefS project

OptiRefS Project

Learn more about the OptiRefS project

Delegates from the 2024 SENTECH Thin Film Metrology Seminar and Workshop

The SENTECH Thin Film Metrology Seminar and Workshop 2024

Read about our cutting-edge thin film metrology seminar and workshop!

Load More