Does SENTECH offer technical service support?
Yes, SENTECH has a large network of technical service experts who offer in-country support for both plasma process technology and thin film metrology systems. Remote or on-site support is possible depending on your requirements. Click here to find out more or to contact the team.
Can I send my samples to SENTECH for analysis?
Yes, SENTECH has two application labs in-house. You can contact our application team, who will share with you all the details and provide a sample analysis form for you to complete. Click here for further information and contact details.
Does SENTECH offer application support?
SENTECH has a large team of application experts for both plasma process technology and thin film metrology. At our campus are two laboratories which are used to process and characterise customer samples, for system demonstrations and customer training. SENTECH offers application support for the lifecycle of your system. Learn more about our application support or […]
Can you deliver SENTECH Ellipsometry Systems internationally?
SENTECH has an international network of distributors and technical service experts. We deliver globally, including Europe, Asia, Africa, North and South America. For more details on in-country representation, click here.
SENTECH Metrology System Overview Brochure
SE 401adv
In-situ laser ellipsometer with a time resolution of 40 ms. HeNe-laser for high stability and reproducibility Kit for easily mounting the sender and receiver modules to the flanges of a process chamber
SE 400adv
Table top equipment HeNe-laser for high stability and reproducibility Highly precise sample alignment Manual goniometer with superior performance and angle accuracy
SE 400adv Multiple-Angle Laser Ellipsometer
The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring measurement speed, Sub-Angstrom precision in thickness, and per mille accuracy in refractive index determination.