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Thin Film Metrology
Spectroscopic Ellipsometry
Versatile and powerful tools that will provide precise and non-destructive characterisation of your thin films and surfaces, an essential tool for understanding and optimising the optical and structural properties of materials.
Spectroscopic Ellipsometer –
SENresearch 4.0
The
SENresearch 4.0
spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry.
Cost Effective Spectroscopic Ellipsometer – SENpro
The SENpro is a cost-effective spectroscopic ellipsometer without compromising advanced measurement performance.
Infrared Spectroscopic Ellipsometer with FTIR – SENDIRA
The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi-layer stacks.
Spectroscopic Ellipsometry Software – SpectraRay/4
The proprietary SpectraRay/4 SENTECH Spectroscopic Ellipsometry Software, includes data acquisition, modeling, fitting, and extended reporting of ellipsometric, reflection, and transmission data.
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Spectroscopic Ellipsometry
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Wafer-level integration challenges of ALD for 2D materials
Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).
Analysing the earth’s heat balance to better understand global warming
The European Space Agency's satellite mission planned for 2027.
The SENTECH “Plasma Process Technology Seminar” 2024
Click here to find out more about the SENTECH Plasma Process Technology Seminar.
The SENTECH Thin Film Metrology Seminar and Workshop
Read the full article to find out more about the seminar.
SENTECH set to expand sales and service offerings in Spain
Welcome to the SENTECH team Izasa Scientific
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