Laser Ellipsometer

Explore our cutting-edge Laser Ellipsometer for highest signal to noise ratio in the analysis and characterisation of thin films.

Combined Ellipsometry and Reflectometry CER – SE 500adv

The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films.

The Multiple Angle Laser Ellipsometer – SE 400adv

The laser ellipsometer SE 400adv measures thickness and refractive index of transparent thin films, featuring measurement speed, Sub-Angstrom precision in thickness, and per mille accuracy in refractive index determination.

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Explore SENTECH products and applications

Spectroscopic Ellipsometry

Spectroscopic Reflectometry

Metrology for quality control

In situ Metrology / Endpoint Detection

News

Wafer-level integration challenges of ALD for 2D materials

Find out about the collaboration between SENTECH and the Ruhr-Universität Bochum (RUB).

Analysing the earth’s heat balance to better understand global warming

The European Space Agency's satellite mission planned for 2027.

The SENTECH “Plasma Process Technology Seminar” 2024

Click here to find out more about the SENTECH Plasma Process Technology Seminar.

The SENTECH Thin Film Metrology Seminar and Workshop

Read the full article to find out more about the seminar.

SENTECH set to expand sales and service offerings in Spain

Welcome to the SENTECH team Izasa Scientific