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Plasma Process Technology
Plasma Process Technology
Low-damage plasma etch and deposition systems from SENTECH
Plasma Etching
ICPECVD Systems
Atomic Layer Deposition Systems
Cluster Configuration for Plasma Etching and Deposition
Thin Film Metrology
Thin Film Metrology
SENTECH thin film metrology tools for repeatable and accurate results
Metrology for Quality Control
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Spectroscopic Reflectometry
Laser Ellipsometry
In-situ Metrology / Endpoint Detection
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Application and Industries
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SI 500 CCP
RIE plasma etch system
Smart solution for He backside-cooled etching
Capacitively coupled plasma source, upgradable to ICP plasma source PTSA 200